IEC TS 61994-4-4:2018 RLV-频率控制、选择和检测用压电、介电和静电器件及相关材料术语第4-4部分:压电材料表面声波（SAW）器件用单晶片-国家数字标准馆

现行 IEC TS 61994-4-4:2018 RLV

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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices 频率控制、选择和检测用压电、介电和静电器件及相关材料术语第4-4部分:压电材料表面声波（SAW）器件用单晶片

发布日期： 2018-11-16

IEC TS 61994-4-4:20 18 RLV包含IEC官方国际标准及其红线版本。Redline版本不是官方文档，它只有英文版本，为您提供了一种快速简单的方法来比较IEC官方标准与其以前版本之间的所有变化。

IEC 61994-4-4:20 18给出了代表现有技术水平的用于表面声波(SAW)器件的单晶晶片的术语和定义。与上一版相比，此版本包括以下重大技术变更:
-已考虑IEC 62276:2016中给出的新术语和定义；
-总标题已根据2009年TC 49标题的变化进行了更改。
-零件标题已根据IEC 62276:2016的标题进行了更改。

IEC TS 61994-4-4:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is not an official document, it is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.

IEC 61994-4-4:2018 gives the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art. This edition includes the following significant technical changes with respect to the previous edition:

- the new terms and definitions given in IEC 62276:2016 have been taken into account;

- the general title has been changed according to the change in the title of TC 49 in 2009.

- the part title has been changed according to the title of IEC 62276:2016.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 31.140电子学 - 频率控制和选择用压电器件与介质器件、 01.040.31词汇 - 电子学 (词汇)

关联关系

研制信息

归口单位： TC 49

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