IEC 63287-1:2021给出了半导体集成电路产品可靠性鉴定计划的指南。本文件不适用于军事和空间相关应用。 附注1 制造商可以使用灵活的样本大小，以降低成本，并通过本指南保持合理的可靠性。根据EDR-4708、AEC Q100、JESD47或其他相关文件（如有规定）进行的修改也可以适用。 附注2 本文件中使用的威布尔分布法是计算给定可靠性项目适当样本量和试验条件的几种方法之一。 第一版IEC 63287-1取消并取代2017年发布的第一版IEC 60749-43。本版为技术修订版。 本版本包括与前一版本相比的以下重大技术变更:；文件已重命名并重新编号，以区别于IEC 60749（所有部分）； 增加了关于“家庭”概念的新章节，对现有案文进行了适当的重新编号。

IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project. This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:;the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.