在莫尔干涉仪X-Y-Z网格传感器中，可以在几秒钟内收集大量数据。这种能力将为制造业打开新的大门，因为通用方法可用于零件检查和过程控制。云纹干涉法不受CMM型技术的限制，在这种技术中，需要大量的机械运动。它也不受单点传感器的限制，在单点传感器中，每个位置获得一个数据点。该技术适用于微观应用以及大视场、大距离应用。

IN A MOIRE INTERFEROMETER X-Y-Z MESH SENSOR, LARGE AMOUNTS OF DATA CAN BE COLLECTED IN A MATTER OF SECONDS. THIS CAPABILITY WILL OPEN NEW DOORS TO MANUFACTURING, AS A COMMON METHODOLOGY CAN BE USED FOR PART INSPECTION AND IN-PROCESS CONTROL. MOIRE INTERFEROMETRY DOES NOT SUFFER FROM THE LIMITATIONS OF CMM-TYPE TECHNOLOGY IN WHICH EXTENSIVE MECHANICAL MOTIONS ARE REQUIRED. NOR DOES IT SUFFER FROM THE LIMITATIONS OF A SINGLE POINT SENSOR IN WHICH ONE DATA POINT IS OBTAINED FOR EACH POSITION. THE TECHNOLOGY IS APPROPRIATE FOR MICROSCOPIC APPLICATIONS AS WELL AS FOR LARGE FIELD-OF-VIEW, LARGE STAND-OFF APPLICATIONS.