1.1本指南涵盖了计算和校准显微镜放大率、摄影放大率、视频监视器放大率、粒度比较分划板和其他测量分划板的方法。反射光显微镜用于表征材料微观结构。许多材料工程决策可能基于微观结构的定性和定量分析。显微镜放大倍数和十字线尺寸必须准确。 1.2使用这些方法的校准仅与使用的测量设备一样精确。 建议校准中使用的台测微计或标尺应可追溯至美国国家标准与技术研究所（NIST）或类似组织。 1.3 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全和健康实践，并确定监管限制的适用性。

1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures. Many materials engineering decisions may be based on qualitative and quantitative analyses of a microstructure. It is essential that microscope magnifications and reticle dimensions be accurate. 1.2 The calibration using these methods is only as precise as the measuring devices used. It is recommended that the stage micrometer or scale used in the calibration should be traceable to the National Institute of Standards and Technology (NIST) or a similar organization. 1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.