Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
金属氧化物、半导体、场效应晶体管（MOSFET）的偏压温度稳定性试验

2006-09-29

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
金属氧化物半导体场效应晶体管（mosfet）的偏温稳定性试验

2006-07-18

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
半导体器件碳化硅分立金属氧化物半导体场效应晶体管可靠性试验方法第1部分:偏置温度不稳定性试验方法

2022-04-21

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
金属氧化物、半导体、场效应晶体管（MOSFET）的偏压温度稳定性试验（IEC 62373-2006）；德文版EN 62373:2006

2007-01-01