1.1 本试验方法初步涵盖了当形成导电路径导致材料因局部热分解、化学分解和侵蚀而导电时，类似材料对靠近绝缘表面的高压、低电流电弧作用的电阻差异。 1.2 本试验方法的有效性受到许多限制和限制，其中一些限制和限制在以下段落和第节中描述 5. . 通常，该试验方法应 不 用于材料规范。只要可能，应使用替代试验方法，并鼓励其发展。 1.3 通常情况下，本试验方法不允许对可能承受其他类型电弧的材料的相对抗电弧性排名得出结论: 例如，高电流下的高电压，以及低或高电流下的低电压（由浪涌或导电污染物引起）。 1.4 由于试验方便且所需时间短，因此该试验方法用于初步筛选材料、检测配方变化的影响，以及在与其他类型的模拟电弧试验和现场经验建立相关性后进行质量控制试验。由于该试验方法通常在清洁干燥的实验室条件下进行，在实践中很少遇到，因此在典型应用和不同的“清洁到肮脏”环境中，对材料相对性能的预测可能会发生实质性变化( 注1 ). 强烈建议不要在没有模拟服务测试和现场测试支持的情况下得出强有力的结论。相反，该试验方法有助于初步评估结构和成分的变化，而不受环境条件（尤其是污垢和水分）的复杂影响。 注1: 通过改变本文所述的一些电路条件，可以显著地重新排列由硫化纤维和模压酚醛和氨基塑料组成的一组有机绝缘材料的抗电弧顺序，其中一些含有有机填料，另一些含有无机填料。 1.5 虽然本试验方法使用干燥、无污染的试样表面，但试验方法 D2132 ，试验方法 D2303 ，以及试验方法 D3638 使用潮湿、受污染的试样表面。建议将其用于工程目的，并协助确定该试验方法在一定程度上的重要性，以达到质量控制目的。 2. 1.6 本试验方法不适用于在电弧作用下不产生导电路径的材料，或熔化或形成液体残留物的材料，该液体残留物将导电残留物浮出活动试验区域，从而防止形成导电路径。 1.7 以英寸-磅为单位的数值应视为标准值。括号中给出的值是到国际单位制的数学转换，仅供参考，不被视为标准值。 1.8 本标准并非旨在解决与其使用相关的所有安全问题（如有）。 本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 有关具体预防说明，请参阅 6.1.14 , 6.1.19 部分 7. 和 10.1.1 . 注2: 由于第节中涵盖的缺陷 1. ，委员会D09提议，如果没有重大改进，该标准将在2027年的下一个5年审查中撤销。提供本通知是为了使参考标准可以转换。 1.9 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 4.1 高压、低电流型电弧电阻测试旨在模拟此类服务 在高压下工作的交流电路中存在的条件，但电流限于单位和几十毫安。 4.2 为了更容易区分低电弧电阻的材料，本试验方法的早期阶段是温和的，后期阶段依次更为严重。电弧在试样表面上的两个电极之间以正常或反向方向间歇性发生。在早期阶段，通过将均匀持续时间的闪光间隔连续减小到零，严重性增加；在后期阶段，通过增加电流，严重性增加。 4.3 观察到四种常见的故障类型: 4.3.1 许多无机电介质变为白炽，因此它们能够传导电流。然而，冷却后，它们会恢复到早期的绝缘状态。 4.3.2 一些有机化合物在没有形成可见导电路径的情况下燃烧。 4.3.3 另一些被认为是通过“跟踪”失败的，也就是说，在电极之间形成一条细细的金属线。 4.3.4 第四种是通过表面碳化，直到有足够的碳来承载电流。 4.4 材料通常在严重性阶段发生变化后的前几秒钟内失效。当比较材料的耐电弧性时，重叠两个阶段的几秒钟应比一个阶段内相同的经过时间更重要。 因此，178和182秒之间的电弧电阻差异比174和178秒之间的差异大得多。 注4: 一些研究人员报告说，他们试图通过允许试样冷却到室温，而不干扰电极的原始位置，来表征故障后受损区域的剩余绝缘值，然后（1）测量电极之间的绝缘电阻或（2）确定剩余击穿电压相对于在试样未损坏区域获得的击穿电压的百分比。中描述了执行这两种方法中的第二种方法来表征受损区域剩余绝缘值的推荐电路布置和测试程序 附录X1 . 另一种明显的重新评估故障后受损区域的方法是，在试样冷却后，在电极未从其原始位置受到干扰的情况下，重复电弧电阻测试。然而，请记住，由于在许多情况下对试验区域造成严重的物理损坏，这些方法都不会普遍适用。

1.1 This test method covers, in a preliminary fashion, the differentiation of similar materials’ resistance to the action of a high-voltage, low-current arc close to the surface of insulation, when a conducting path is formed causing the material to become conducting due to the localized thermal and chemical decomposition and erosion. 1.2 The usefulness of this test method is very severely limited by many restrictions and qualifications, some of which are described in the following paragraphs and in Section 5 . Generally, this test method shall not be used in material specifications. Whenever possible, alternative test methods shall be used, and their development is encouraged. 1.3 This test method will not, in general, permit conclusions to be drawn concerning the relative arc resistance rankings of materials that are potentially subjected to other types of arcs: for example, high voltage at high currents, and low voltage at low or high currents (promoted by surges or by conducting contaminants). 1.4 The test method is intended, because of its convenience and the short time required for testing, for preliminary screening of material, for detecting the effects of changes in formulation, and for quality control testing after correlation has been established with other types of simulated service arc tests and field experience. Because this test method is usually conducted under clean and dry laboratory conditions rarely encountered in practice, it is possible that the prediction of a material's relative performance in typical applications and in varying “clean to dirty” environments will be substantially altered ( Note 1 ). Caution is urged against drawing strong conclusions without corroborating support of simulated service tests and field testing. Rather, this test method is useful for preliminary evaluation of changes in structure and composition without the complicating influence of environmental conditions, especially dirt and moisture. Note 1: By changing some of the circuit conditions described herein it has been found possible to rearrange markedly the order of arc resistance of a group of organic insulating materials consisting of vulcanized fiber and of molded phenolic and amino plastics, some containing organic, and some inorganic, filler. 1.5 While this test method uses dry, uncontaminated specimen surfaces, Test Method D2132 , Test Methods D2303 , and Test Method D3638 employ wet, contaminated specimen surfaces. Their use is recommended for engineering purposes and to assist in establishing some degree of significance to this test method for quality control purposes. 2 1.6 This test method is not applicable to materials that do not produce conductive paths under the action of an electric arc, or that melt or form fluid residues that float conductive residues out of the active test area thereby preventing formation of a conductive path. 1.7 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard. 1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see 6.1.14 , 6.1.19 , Section 7 , and 10.1.1 . Note 2: Due to the deficiencies covered in Section 1 , Committee D09 has proposed that without significant proposed improvements this standard be withdrawn in 2027 during its next 5 year review. This notice is provided so that referencing standards can transition. 1.9 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 The high-voltage, low-current type of arc resistance test is intended to simulate only approximately such service conditions as exist in alternating current circuits operating at high voltage, but at currents limited to units and tens of milliamperes. 4.2 In order to distinguish more easily among materials that have low arc resistance, the early stages of this test method are mild, and the later stages are successively more severe. The arc occurs intermittently between two electrodes resting on the surface of the specimen, in normal or inverted orientation. The severity is increased in the early stages by successively decreasing to zero the interval between flashes of uniform duration, and in later stages by increasing the current. 4.3 Four general types of failure have been observed: 4.3.1 Many inorganic dielectrics become incandescent, whereupon they are capable of conducting the current. Upon cooling, however, they return to their earlier insulating condition. 4.3.2 Some organic compounds burst into flame without the formation of a visible conducting path in the substance. 4.3.3 Others are seen to fail by “tracking,” that is, a thin wiry line is formed between the electrodes. 4.3.4 The fourth type occurs by carbonization of the surface until sufficient carbon is present to carry the current. 4.4 Materials often fail within the first few seconds after a change in the severity stage. When comparing the arc resistance of materials, much more weight shall be given to a few seconds that overlap two stages than to the same elapsed time within a stage. Thus, there is a much greater difference in arc resistance between 178 and 182 s than between 174 and 178 s. Note 4: Some investigators have reported attempts to characterize the remaining insulating value of the damaged area after failure by allowing the specimen to cool to room temperature, without disturbance of the original position of the electrodes, and then either (1) measuring the insulation resistance between the electrodes or (2) determining the percentage of breakdown voltage remaining relative to that obtained on an undamaged area of the specimen. A recommended circuit arrangement and test procedure for carrying out the second of these two means of characterizing the remaining insulating value of the damaged area is described in Appendix X1 . Still another, and obvious, method of reevaluating the damaged area after failure is to repeat the arc resistance test after the specimen has cooled, with the electrodes undisturbed from their original positions. However, keep in mind that none of these methods will be universally applicable because of the severe physical damage to the test area in many instances.