Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings
纳米技术 人造光栅的描述、测量和尺寸质量参数
发布日期:
2013-02-28
交叉引用:ISO/IEC 17025ISO/TS 80004-1:2010SEMI P35ISO 14660-1:1999ISO 15902:2004ISO/TS 16610-1:2006ISO 29301:2010ISO 16700:2004ISO/CD 11952ISO/CD 25178-70DIN 2268:1975OIML R 98GOST R 8.628-2007GOST R 8.629-2007GOST R 8.630-2007GOST R 8.631-2007GOST R 8.635-2007GOST R 8.644-2008购买时可提供所有当前修订版文件
Cross References:ISO/IEC 17025ISO/TS 80004-1:2010SEMI P35ISO 14660-1:1999ISO 15902:2004ISO/TS 16610-1:2006ISO 29301:2010ISO 16700:2004ISO/CD 11952ISO/CD 25178-70DIN 2268:1975OIML R 98GOST R 8.628-2007GOST R 8.629-2007GOST R 8.630-2007GOST R 8.631-2007GOST R 8.635-2007GOST R 8.636-2007GOST R 8.644-2008All current amendments available at time of purchase are included with the purchase of this document.