首页 馆藏资源 舆情信息 标准服务 科研活动 关于我们
正在批准 20204839-T-339
到馆提醒
收藏跟踪
购买正版
集成电路 电磁抗扰度测量 第4部分:射频功率直接注入法 Integrated circuits—Measurement of electromagnetic immunity—Part 4: Direct RF power injection method
下达日期: 2020-12-24
分类信息
关联关系
研制信息
相似标准/计划/法规
现行
IEC 62132-8-2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法
2012-07-06
现行
IEC TS 62132-9-2014
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法
2014-08-21
现行
GB/T 42968.8-2023
集成电路 电磁抗扰度测量 第8部分:辐射抗扰度测量 IC带状线法
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
2023-09-07
现行
IEC 62132-1-2015
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义
2015-10-29
现行
GB/T 42968.1-2023
集成电路 电磁抗扰度测量 第1部分:通用条件和定义
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions
2023-09-07
现行
IEC 62132-2-2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
集成电路 - 电磁抗扰度测量 - 第2部分:辐射抗扰度测量 - 温度计和宽带电池法
2010-03-30
现行
GB/T 42968.2-2024
集成电路 电磁抗扰度测量 第2部分:辐射抗扰度测量 TEM小室和宽带TEM小室法
Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
2024-10-26
现行
IEC 62132-4-2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
集成电路 - 电磁抗扰度测量150 Khz至1 Ghz - 第4部分:直接Rf功率注入法
2006-02-21
现行
BS 09/30191126 DC
BS EN 62132-8. Integrated circuits. Measurement of electromagnetic immunity. Part 8. Measurement of radiated immunity. IC Stripline method
英国标准EN 62132-8 集成电路 电磁抗扰度的测量 第八部分 辐射抗扰度的测量 集成电路带线法
2009-02-03
现行
DIN IEC/TS 62132-9
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法(IEC/TS 62132-9-2014)
2015-08-01
现行
DIN IEC 62132-8-DRAFT
Draft Document - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
文件草案——集成电路——电磁抗扰度测量——第8部分:辐射抗扰度测量——IC带状线法(IEC 47A/811/CD:2009)
2009-05-01
现行
IEC 62132-5-2005
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
集成电路 - 电磁抗扰度测量 150 Khz至1 Ghz - 第5部分:工作台法拉第笼式
2005-10-10
现行
DIN EN 62132-8
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
集成电路.电磁抗扰度的测量.第8部分:辐射抗扰度的测量.集成电路带状线法(IEC 62132-8-2012);德文版EN 62132-8:2012
2013-03-01
现行
BS 03/105045 DC
IEC 62132-3. Ed.1. Integrated circuits. Measurement of electromagnetic immunity, 150 KHz to 1 GHz. Part 3. Measurement of conducted immunity. Bulk current injection method
IEC 62132-3 Ed.1 集成电路 电磁抗扰度测量 150 KHz至1 GHz 第三部分 传导抗扰度的测量 大电流注入法
2003-08-11
现行
DIN EN 62132-4
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method (IEC 62132-4:2006); German version EN 62132-4:2006
集成电路.150 kHz至1 GHz电磁抗扰度的测量.第4部分:直接射频功率注入法(IEC 62132-4-2006);德文版EN 62132-4:2006
2006-10-01
现行
BS 11/30206517 DC
BS EN 62132-6. Integrated circuits. Measurement of electromagnetic immunity. Part 6. Local Injection Horn Antenna (LIHA) method
英国标准EN 62132-6 集成电路 电磁抗扰度的测量 第六部分 局部注入喇叭天线(LIHA)法
2011-01-05
现行
SJ 21147.4-2016
军用集成电路电磁发射测量方法 第4部分:传导发射测量 - 1Ω/150Ω直接耦合法
Measurement of electromagnetic emissions for military integrated circuits - Part 4:Measurement of conducted emissions - 1Ω/150Ω direct coupling method
2016-01-19
现行
IEC 61967-4-2021 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射的测量第4部分:传导发射的测量1欧姆/150欧姆直接耦合法
2021-03-16
现行
IEC 61967-4-2021
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射
2021-03-16
现行
DIN EN 62132-2
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
集成电路.电磁抗扰度测量.第2部分:辐射抗扰度测量.TEM室和宽带TEM室法(IEC 62132-2-2010);德文版EN 62132-2:2011
2011-07-01