KS C IEC 62951-1-2022-半导体器件.柔性和可拉伸半导体器件.第1部分:柔性衬底上导电薄膜的弯曲试验方法-国家数字标准馆

现行 KS C IEC 62951-1-2022

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반도체소자 — 유연성 및 신축성 반도체소자 — 제1부: 유연성 기판의 전도성 박막에 대한 굽힘 시험방법 半导体器件.柔性和可拉伸半导体器件.第1部分:柔性衬底上导电薄膜的弯曲试验方法

发布日期： 2022-11-22

该标准规定了一种弯曲试验方法，用于测定在柔性非导电基板上沉积或粘附的导电薄膜的机电特性或弹性。柔性基板的导电薄膜广泛用于柔性电子元件及柔性半导体。导电薄膜包括在非导电柔性基板上沉积或粘附的所有膜，如金属薄膜、透明电极和硅薄膜。柔性基板薄膜的电学和机械行为与膜与基板之间的界面相互作用及粘接引起的独立薄膜及基板不同。该标准的目的是建立一种简单、可重复的试验方法，以评估柔性基板导电薄膜的机电特性或弹性。弯曲试验方法包括外侧弯曲试验和内侧弯曲试验。

이 표준은 플렉시블 비전도성 기판에 증착되거나 접착된 전도성 박막의 전기 기계적 특성 또는 신축성을 측정하기 위한 굽힘 시험방법을 규정한다. 플렉시블 기판의 전도성 박막은 플렉시블 전자 소자 및 플렉시블 반도체에 광범위하게 사용된다. 전도성 박막에는 금속 박막, 투명전극 및 실리콘 박막 같은 비전도성 플렉시블 기판에 증착 또는 접착된 모든 막이 포함된다. 플렉시블 기판 박막의 전기적 및 기계적 거동은 막과 기판 사이의 계면 상호작용 및 접착으로 인한 독립 박막 및 기판과 다르다. 이 표준의 목적은 플렉시블 기판의 전도성 박막의 전기 기계적 특성 또는 신축성을 평가하기 위한 간단하고 반복 가능한 시험방법을 설정하는 것이다. 굽힘 시험방법에는 외측 굽힘 시험과 내측 굽힘 시험이 포함된다.

分类信息

发布单位或类别：韩国-韩国标准

ICS分类： 31.080.99半导体分立器件 - 其他半导体分立器件

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