该应力法用于确定射频偏置条件和温度对功率的影响 放大器模块（PAM）随时间变化。这些条件旨在模拟设备？操作 以加速的方式进行，预计它们主要用于设备鉴定和测试 可靠性监控。

This stress method is used to determine the effects of RF bias conditions and temperature on Power Amplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operating condition in an accelerated way, and they are expected to be applied primarily for device qualification and reliability monitoring.