BS EN ISO 18452:2016规定了测定精细陶瓷膜厚度的方法 通过接触探针轮廓仪测量陶瓷涂层。该方法适用于范围内的薄膜厚度 当然可以。注:该方法要求在基材的涂层和未涂层部分之间有一个清晰的边界。交叉引用:ISO 3274购买本文件时提供的所有现行修订均包含在购买本文件中。

BS EN ISO 18452:2016 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of to.NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.Cross References:ISO 3274All current amendments available at time of purchase are included with the purchase of this document.