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集成电路 电磁发射测量 第5部分:传导发射测量 工作台法拉第笼法 Integrated circuits - Measurement of electromagnetic emissions,150kHz to 1GHz-Part 5:Measurement of conducted emissions?- Workbench Faraday Cage method
下达日期: 2021-10-13
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现行
BS EN IEC 61967-1-2019
Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions
集成电路 电磁辐射的测量 一般条件和定义
2019-02-21
现行
IEC 61967-8-2023 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法
2023-05-03
现行
IEC 61967-8-2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法
2023-05-03
现行
IEC TS 61967-3-2014
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法
2014-08-25
现行
YD/T 1690.6-2007
电信设备内部电磁发射诊断技术要求和测量方法(150kHz~1GHz) 第6部分:传导发射测量 磁场探头方法
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 6:Measurement of Conducted Emissions-Magnetic Probe Method
2007-09-29
现行
YD/T 1690.3-2007
电信设备内部电磁发射诊断技术要求和测量方法(150kHz~1GHz) 第3部分:辐射发射测量 外表扫描方法
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 3:Measurement of Radiated Emissions-Surface Scan Method
2007-09-29
现行
IEC 61967-1-2018
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路电磁辐射测量第1部分:一般条件和定义
2018-12-12
现行
IEC 61967-1-2018 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路.电磁辐射的测量.第1部分:一般条件和定义
2018-12-12
现行
SJ 21147.3-2016
军用集成电路电磁发射测量方法 第3部分:辐射发射测量-表面扫描法
Measurement of electromagnetic emissions for military integrated circuits - Part 3:Measurement of radiated emissions - Surface scan method
2016-01-19
现行
YD/T 1690.5-2007
电信设备内部电磁发射诊断技术要求和测量方法(150kHz~1GHz) 第5部分:传导发射测量 法拉第笼方法
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 5:Measurement of Conducted Emissions-Workbench Faraday Cage Method
2007-09-29
现行
YD/T 1690.1-2007
电信设备内部电磁发射诊断技术要求和测量方法(150kHz~1GHz) 第1部分:通用条件和定义
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 1:General Conditions and Definitions
2007-09-29
现行
BS EN IEC 61967-4-2021
Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
集成电路 电磁辐射测量
2021-05-06
现行
SJ 21147.5-2016
军用集成电路电磁发射测量方法 第5部分:传导发射测量-工作台法拉第笼法
Measurement of electromagnetic emissions for military integrated circuits - Part 5:Measurement of conducted emissions - Workbench Faraday Cage method
2016-01-19
现行
SJ 21147.1-2016
军用集成电路电磁发射测量方法 第1部分:通用条件和定义
Measurement of electromagnetic emissions for military integrated circuits - Part 1:General conditions and definitions
2016-01-19
现行
YD/T 1690.4-2007
电信设备内部电磁发射诊断技术要求和测量方法(150kHz~1GHz) 第4部分:传导发射测量 1Ω/150Ω直接耦合方法
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 4:Measurement of Conducted Emissions-1Ω/150Ω Direct Coupling Method
2007-09-29
现行
BS EN 61967-5-2003
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路 电磁辐射测量 150 kHz至1 GHz
2003-06-17
现行
SJ 21147.4-2016
军用集成电路电磁发射测量方法 第4部分:传导发射测量 - 1Ω/150Ω直接耦合法
Measurement of electromagnetic emissions for military integrated circuits - Part 4:Measurement of conducted emissions - 1Ω/150Ω direct coupling method
2016-01-19
现行
YD/T 1690.2-2007
电信设备内部电磁发射诊断技术要求和测量方法(150kHz~1GHz) 第2部分:辐射发射测量 TEM小室和宽带TEM小室方法
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 2:Measurement of Radiated Emissions TEM Cell and Wideband TEM Cell Method
2007-09-29
现行
IEC 61967-4-2021 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射的测量第4部分:传导发射的测量1欧姆/150欧姆直接耦合法
2021-03-16
现行
IEC 61967-6-2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法
2002-06-25