Measurement techniques of piezoelectric, dielectric and electrostatic oscillators-Phase jitter measurement method
压电、介电和静电振荡器的测量技术
发布日期:
2017-12-08
BS EN 62884-2:2017规定了测量和评估
压电、介电和静电振荡器的相位抖动测量,包括
介质谐振器振荡器(DRO)和使用薄膜体声波谐振器的振荡器
(FBAR)(以下简称“振荡器”),并给出相位抖动的指导
允许精确测量RMS抖动。在测量方法中,相位噪声测量设备或相位噪声
采用测量系统。
交叉引用:IEC 62884-1:2017IEC 60050-561:2014ISO 80000-12:2009 Ed 1IEC 60617IEC 60027IEC 60469:2013IEC 60679-1:2017EN 60027EN ISO 80000-1ITU-T O.172EN 60469EN 60679-1:2017EN 62884-1:2017购买本文件时提供的所有当前修订版均包含在购买本文件中。
BS EN 62884-2:2017 specifies the methods for the measurement and evaluation of the
phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including
dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator
(FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that
allows the accurate measurement of RMS jitter.In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.Cross References:IEC 62884-1:2017IEC 60050-561:2014ISO 80000-12:2009 Ed 1IEC 60617IEC 60027IEC 60469:2013IEC 60679-1:2017EN 60027EN ISO 80000-1ITU-T O.172EN 60469EN 60679-1:2017EN 62884-1:2017All current amendments available at time of purchase are included with the purchase of this document.