太阳能电池用砷化镓单晶抛光片
Monocrystalline gallium arsenide polished wafers for solar cell

2017-12-29

砷化镓外延层厚度红外干涉测量方法
Measuring thickness of epitaxial layers of gallium arsenide by infrared interference

2006-07-18

砷化镓晶片热稳定性的试验方法
Test method for thermal stability testing of gallium arsenide wafers

2015-04-30

氮化镓外延片及衬底片通用规范
General specification for epitaxial wafers and substrates based on gallium nitride

2018-12-28

光致发光法测定磷镓砷晶片的组分
Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence

2015-04-30

砷化镓外延层载流子浓度电容-电压测量方法
Gallium arsenide epitaxial layer - determination of carrier concentration voltage-capacitance method

2006-07-18

水平法砷化镓单晶及切割片
Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method

2020-09-29

高电子迁移晶体管用半绝缘砷化镓抛光片规范
Specification for semi-insulating gallium arsenide polished wafers for high electron mobility transistor

2016-01-19

低位错密度砷化镓抛光片蚀坑密度的测量方法
Test method for measuring etch pit density (EPD) in low dislocation density gallium arsenide wafers

2015-04-30

砷化镓抛光片亚损伤层的X射线双晶衍射试验方法
Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction

1998-03-18