现行

JB/T 12962.3-2016

能量色散X射线荧光光谱仪 第3部分：镀层厚度分析仪
Energy dispersive X-ray fluorescence spectrometer-Part 3: Plating thickness analyzer

2016-10-22

现行

JJF 1306-2011

X射线荧光镀层测厚仪校准规范
Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments

2011-09-14

现行

KS D ISO 3497(2017 Confirm)

도금두께 시험방법-X선 분광광도법
金属涂层 - 涂层厚度的测量 - X射线光谱仪的方法

2002-07-06

现行

KS D ISO 3497(2022 Confirm)

도금두께 시험방법-X선 분광광도법
金属镀层镀层厚度的测量X射线光谱法

2002-07-06

现行

ISO 3497-2000

Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
金属涂层——涂层厚度的测量——X射线光谱测定法

2000-12-21

现行

BS EN ISO 3497-2001

Metallic coatings. Measurement of coating thickness. X-ray spectrometric methods
金属涂层 涂层厚度的测量 X射线光谱测定法

2001-03-15

现行

ASTM B568-98(2021)

Standard Test Method for Measurement of Coating Thickness by X-Ray Spectrometry
通过X射线光谱法测量涂层厚度的标准测试方法

2021-04-01

现行

GB/T 16921-2005

金属覆盖层 覆盖层厚度测量 X射线光谱法
Metallic coatings -- Measurement of coating thickness -- X-ray spectrometric methods

2005-10-12

现行

ASTM D7639-22

Standard Test Method for Determination of Zirconium Treatment Weight or Thickness on Metal Substrates by X-Ray Fluorescence
用X射线荧光法测定金属基底上锆处理重量或厚度的标准试验方法

2022-12-01

现行

VDI 2267 Sheet 2

Determination of suspended particulates in ambient air; measurement of lead by X-ray fluorescence
环境空气中悬浮颗粒物的测定；X射线荧光法测定铅

1983-02-01

现行

ISO 14701-2018

Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
表面化学分析 - X射线光电子能谱 - 氧化硅厚度的测量

2018-10-31

现行

BS ISO 14701-2018

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
表面化学分析 X射线光电子能谱 氧化硅厚度的测量

2018-11-05

现行

QB/T 1135-2006

首饰 金、银覆盖层厚度的测定 X射线荧光光谱法
Jewellery-Measurement of gold and silver coating tickness-X-ray fluorescence spectrometric methods

2006-08-19

现行

JJF 1613-2017

掠入射X射线反射膜厚测量仪器校准规范
Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity

2017-02-28

现行

GB/T 25188-2010

硅晶片表面超薄氧化硅层厚度的测量X射线光电子能谱法
Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy

2010-09-26

现行

UNE-EN ISO 3497-2001

Metallic coatings. Measurement of coating thickness. X-ray spectrometric methods. (ISO 3497:2000).
金属涂层 涂层厚度的测量 X射线光谱测定法 （ISO 3497:2000）

2001-09-30

现行

ASTM E2120-10(2016)

Standard Practice for Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
便携式X射线荧光光谱仪性能评估的标准实践 用于测量漆膜中的铅

2016-03-01

现行

BS EN ISO 16526-2-2020

Non-destructive testing. Measurement and evaluation of the X-ray tube voltage-Constancy check by the thick filter method
无损检测 X射线管电压的测量和评估

2020-03-19

现行

GB/T 24578-2015

硅片表面金属沾污的全反射X光荧光光谱测试方法
Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy

2015-12-10

现行

UNE-EN 12544-2-2000

NON-DESTRUCTIVE TESTING. MEASUREMENT AND EVALUATION OF THE X-RAY TUBE VOLTAGE. PART 2: CONSTANCY CHECK BY THE THICK FILTER METHOD.
无损检测 X射线管电压的测量和评估 第2部分:通过粗滤器方法进行恒定性检查

2000-07-17