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Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes 半导体器件第5-11部分:光电子器件发光二极管发光二极管辐射电流和非辐射电流的试验方法
发布日期: 2019-12-11
IEC 60747-5-11:2019(E)规定了无荧光粉的单个发光二极管(LED)芯片或封装的辐射和非辐射电流的测量方法。用于照明应用的白色LED不在本文件范围内。本文件利用内部量子效率(IQE)作为电流的函数,其测量方法在其他文件中讨论。
IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.
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归口单位: TC 47/SC 47E
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