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现行 EIA/JESD 22-B105B
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Test Methods and Procedures for Solid State Devices - Test Method B105-A Lead Integrity 固态器件的试验方法和程序.试验方法B105-A导线完整性
发布日期: 1999-01-01
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发布单位或类别: 美国-电子工业联合会
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