IEC 61000-4-20:20 22重点介绍了使用各种类型横向电磁(TEM)波导的电气和电子设备的发射和抗扰度测试方法。这些类型包括开放结构（例如带状线和电磁脉冲模拟器）和封闭结构（例如TEM单元）。这些结构可以进一步分类为单端口、双端口或多端口TEM波导。频率范围取决于具体的测试要求和具体的TEM波导类型。本文档的目的是描述 TEM波导特性，包括典型频率范围和被测设备（EUT）尺寸限制； 电磁兼容性（EMC）测试的TEM波导验证方法； EUT（即EUT机柜和布线）定义；TEM波导中辐射发射测量的测试装置、程序和要求；和 TEM波导辐射抗扰度测试的测试装置、程序和要求。 笔记？本文件中定义了测试方法，以测量电磁辐射对设备的影响以及相关设备的电磁辐射。电磁辐射的模拟和测量不够精确，无法定量确定所有最终用途装置的影响。定义的测试方法的主要目的是在各种测试设施中建立足够的结果再现性，以进行效果的定性分析。 本文件不打算指定应用于任何特定设备或系统的测试。本文件的主要意图是为IEC所有感兴趣的产品委员会提供一个通用的基本参考。对于辐射发射测量，产品委员会根据CISPR标准选择发射限值和测量方法。对于辐射抗扰度测试，产品委员会仍然负责适当选择适用于其范围内设备的抗扰度测试和抗扰度测试限值。本文件描述了不同于IEC 61000的测试方法？4？3. 这第三版取消并取代了2010年出版的第二版。本版构成技术修订版。与上一版相比，此版本包括以下重大技术变更: 提供大型EUT（包括电缆）测试的信息；通过改编CISPR和TC 77（排放和抗扰度）中完成的工作来应用测量不确定度的工作； 更新关于场均匀性和TEM模式验证的测试体积的确认程序； 提供有关二端口和四端口TEM波导的信息； 增加一个新的资料性附件（附件一），涉及瞬态TEM波导表征；和 添加有关EUT介电测试台的信息。

IEC 61000-4-20:2022 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example striplines and electromagnetic pulse simulators) and closed structures (for example TEM cells). These structures can be further classified as one-port, two-port, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this document is to describe

• TEM waveguide characteristics, including typical frequency ranges and equipment-under-test (EUT) size limitations;
• TEM waveguide validation methods for electromagnetic compatibility (EMC) tests;
• the EUT (i.e. EUT cabinet and cabling) definition;
• test set-ups, procedures, and requirements for radiated emission measurements in TEM waveguides; and
• test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

NOTE？Test methods are defined in this document to measure the effects of electromagnetic radiation on equipment and the electromagnetic emissions from the equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for the quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate reproducibility of results at various test facilities for qualitative analysis of effects.
This document does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this document is to provide a general basic reference for all interested product committees of the IEC. For radiated emission measurements, product committees select emission limits and measurement methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This document describes test methods that are separate from those of IEC 61000？4？3.
This third edition cancels and replaces the second edition published in 2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:

1. provide information on the testing of large EUTs (including cables);
2. apply the work on measurement uncertainties by adapting the work completed in CISPR and TC 77 (for emissions and immunity);
3. update the validation procedure for the test volume regarding field uniformity and TEM mode verification;
4. provide information concerning two-port and four-port TEM waveguides;
5. add a new informative annex (Annex I) dealing with transient TEM waveguide characterization; and
6. add information dealing with dielectric test stands for EUTs.