IEC 62396-8:20 20旨在提供关于小粒子（即质子、电子、π介子和μ子通量）的影响和单个事件对在高达60 000英尺（18 300米）高度运行的飞机中使用的航空电子设备的影响的认识和指导。这是一个新兴的话题，缺乏实质性的支撑数据。本文件旨在通过为这一新兴主题提供意识指导来帮助航空航天或地面电子设备制造商和设计师。 提供辐射环境的细节以及由接收到的大气辐射引起的潜在问题的识别。给出了适当的方法来量化电子元件中的单事件效应（见）率。

IEC 62396-8:2020 is intended to provide awareness and guidance with regard to the effects of small particles (that is, protons, electrons, pions and muon fluxes) and single event effects on avionics electronics used in aircraft operating at altitudes up to 60 000 feet (18 300 m). This is an emerging topic and lacks substantive supporting data. This document is intended to help aerospace or ground level electronic equipment manufacturers and designers by providing awareness guidance for this new emerging topic.
Details of the radiation environment are provided together with identification of potential problems caused as a result of the atmospheric radiation received. Appropriate methods are given for quantifying single event effect (SEE) rates in electronic components.