IEC 61000的本部分重点介绍了使用各种类型横向电磁波导的电气和电子设备的发射和抗扰度测试方法。这些类型包括开放结构（例如带状线和电磁脉冲模拟器）和闭合结构（例如TEM室）。这些结构可以进一步分类为单端口、双端口或多端口TEM波导。频率范围取决于具体的测试要求和具体的TEM波导类型。本文件旨在描述TEM波导特性，包括典型频率范围和被测设备（EUT）尺寸限制电磁兼容性（EMC）试验的TEM波导验证方法；-EUT（即EUT机柜和电缆）定义；-测试集- 瞬变电磁波导中辐射发射测量的不间断电源、程序和要求；和-TEM波导辐射抗扰度测试的测试装置、程序和要求。注:本文件规定了测试方法，以测量电磁辐射对设备的影响以及相关设备的电磁发射。电磁辐射的模拟和测量不足以精确地定量确定所有最终用途装置的影响。定义的测试方法的主要目的是在各种测试设施中建立足够的结果再现性，以便对影响进行定性分析。本文件不打算规定适用于任何特定装置或系统的试验。本文件的主要目的是为IEC所有相关产品委员会提供一般基本参考。 对于辐射发射测量，产品委员会根据CISPR标准选择发射限值和测量方法。对于辐射抗扰度测试，产品委员会仍负责适当选择适用于其范围内设备的抗扰度测试和抗扰度测试极限。本文件描述了与IEC 61000-4-3[34]中的测试方法不同的测试方法。

This part of IEC 61000 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example striplines and electromagnetic pulse simulators) and closed structures (for example TEM cells). These structures can be further classified as one-port, two-port, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.The object of this document is to describe- TEM waveguide characteristics, including typical frequency ranges and equipment-undertest (EUT) size limitations;- TEM waveguide validation methods for electromagnetic compatibility (EMC) tests;- the EUT (i.e. EUT cabinet and cabling) definition;- test set-ups, procedures, and requirements for radiated emission measurements in TEM waveguides; and- test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.NOTE Test methods are defined in this document to measure the effects of electromagnetic radiation on equipment and the electromagnetic emissions from the equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for the quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate reproducibility of results at various test facilities for qualitative analysis of effects.This document does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this document is to provide a general basic reference for all interested product committees of the IEC. For radiated emission measurements, product committees select emission limits and measurement methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This document describes test methods that are separate from those of IEC 61000-4-3 [34].