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现行 JIS R 1636:1998
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Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer GB/T-精细陶瓷薄膜厚度试验方法接触探针轮廓仪测量薄膜厚度
发布日期: 1998-01-01
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发布单位或类别: 日本-日本工业标准调查会
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