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现行 IEC 60384-21:2024 CMV
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Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 电子设备用固定电容器第21部分:分规范第1类陶瓷介质表面贴装多层固定电容器
发布日期: 2024-06-21
IEC 60384-21:20 24 CMV包含官方标准及其注释版本。注释版本为您提供了一种快速简单的方法来比较IEC 60384-21:20 24版4.0和之前的IEC 60384-21:20 19版3.0之间的所有更改。此外,还提供了IEC TC 40专家的意见,以解释最相关变更的原因,或澄清内容的任何部分。 IEC 60384-21:20 24适用于具有规定温度系数(电介质等级1)的陶瓷电介质的固定未封装表面贴装多层电容器,旨在用于电子设备。这些电容器具有金属化的连接垫或焊带,旨在安装在印刷电路板上,或直接安装在混合电路的衬底上。不包括用于抑制电磁干扰的电容器,但在IEC 60384-14.本文件的目的是规定优选的额定值和特性,并从IEC 60384-1:20 21中选择适当的质量评估程序、测试和测量方法,并给出此类电容器的一般性能要求。参考本部分规范的详细规范中规定的测试严重性和要求提供了同等或更高性能水平的特定测试严重性和要求。有关通用、分段和详细规范概念的更多信息,请参见IEC 60384-1:20 21的介绍。 与上一版相比,此版本包括以下重大技术变更: a)该文件已完全重组,以符合ISO/IEC指令第2部分并使其更易于使用;表格、数字和参考文献已作相应修订;附件十包含条款/子条款编号变更的所有交叉引用; b)术语已被表3中的字母符号取代; c)表4、表6、表8、表9、表11、表13、表16和附录B中增加了C0G、U2J的温度系数和公差代码; d)5.9.3、5.10.5、5.11.4、5.11.4、5.13.7、5.14.5和5.15.5重复了5.5.2中的要求(目视检查); e)5.9.1中增加了非常稳健设计中的挠度D; f)附件B已从资料性改为规范性; g)新增条款C.5(质量符合性检验的试验计划),撤回空白详细规范:IEC 60384-21-1。
IEC 60384-21:2024 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 60384-21:2024 edition 4.0 and the previous IEC 60384-21:2019 edition 3.0. Furthermore, comments from IEC TC 40 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content.

IEC 60384-21:2024 is applicable to fixed unencapsulated surface mount multilayer capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 1), intended for use in electronic equipment. These capacitors have metallized connecting pads or soldering strips and are intended to be mounted on printed boards, or directly onto substrates for hybrid circuits. Capacitors for electromagnetic interference suppression are not included but are covered by IEC 60384-14. The object of this document is to specify preferred ratings and characteristics and to select from IEC 60384-1:2021 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. Test severities and requirements specified in detail specifications referring to this sectional specification provide specific test severities and requirements of an equal or higher performance level. Further information on the conception of generic, sectional and detail specifications can be found in the Introduction of IEC 60384-1:2021.
This edition includes the following significant technical changes with respect to the previous edition:
a) the document has been completely restructured to comply with the ISO/IEC Directives, Part 2 and to make it more useable; tables, figures and references have been revised accordingly; Annex X contains all cross-references of changes in clause/subclause numbers;
b) the terms have been replaced by the letter symbols in Table 3;
c) code of temperature coefficient and tolerance of C0G, U2J have been added in Table 4, Table 6, Table 8, Table 9, Table 11, Table 13, Table 16 and Annex B;
d) the requirement in 5.5.2(visual examination) has been repeated in 5.9.3, 5.10.5, 5.11.4, 5.11.4, 5.13.7, 5.14.5 and 5.15.5;
e) the deflection D in the very robust designs has been added in 5.9.1;
f) Annex B has been changed informative into normative;
g) Clause C.5 (Test schedule for quality conformance inspection) has been newly added to withdraw the blank detail specification: IEC 60384-21-1.
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归口单位: TC 40
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