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Microbeam analysis — Electron probe microanalyser (EPMA) — Guidelines for performing quality assurance procedures 微束分析 - 电子探针显微分析仪(EPMA) - 执行质量保证程序的指南
发布日期: 2018-07-26
本文件提供了在电子探针微量分析仪(EPMA)上执行常规诊断和质量保证程序的指南。仪器操作员应定期使用它,以确认仪器的性能是否达到最佳状态,并在故障排除时提供帮助。它涵盖了独立测试和全面评估EPMA系统主要部件功能所需的标准物质特性和分析程序。 本文描述的分析程序不同于单元素诊断程序,后者可以更快地执行。此类程序适用于衍射位置和进行测试的条件,而本文所述程序旨在证明仪器对未知量的探索性分析、痕量分析和非元素分析的能力- 常规工作(如峰值干扰)。 本文件适用于EPMA和其他波长色散光谱仪(WDS)系统,其中通过分析波长色散X射线光谱中观察到的特征X射线线的能量和强度来进行元素识别和量化。它不直接适用于使用能量色散光谱法(EDS)的元素分析。
This document provides guidelines for performing routine diagnostics and quality assurance procedures on electron probe microanalysers (EPMA). It is intended to be used periodically by an instrument's operator to confirm that the instrument is performing optimally, and to aid in troubleshooting if it is not. It covers the properties of reference materials required and the analysis procedures necessary to independently test and fully evaluate the functionality of the main components of an EPMA system. The analytical procedure described herein is distinct from single-element diagnostic procedures, which can be performed more rapidly. Such procedures are valid for the diffractor position and conditions under which the test is performed, whereas the procedure described herein is intended to qualify an instrument's capabilities for exploratory analysis of unknowns, trace analysis and non-routine work (such as peak interferences). This document is applicable to EPMA and other wavelength dispersive spectrometer (WDS) systems in which elemental identification and quantification are performed by analysis of the energy and intensity of the characteristic X-ray lines observed in wavelength-dispersed X-ray spectra. It is not directly applicable to elemental analysis using energy dispersive spectrometry (EDS).
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归口单位: ISO/TC 202/SC 2
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