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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005 集成电路.150 kHz至1 GHz电磁发射的测量.第2部分:辐射发射的测量.TEM室和宽带TEM室法(IEC 61967-2-2005);德文版EN 61967-2:2005
发布日期: 2006-03-01
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发布单位或类别: 德国-德国标准化学会
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BS EN 61967-5-2003
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2003-06-17
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IEC 61967-6-2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法
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IEC 61967-4-2021
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IEC 61967-6-2002+AMD1-2008 CSV
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집적 회로-150 kHz에서 1 GHz의 전기 자기 장해 측정-제4부:전도 장해 측정-1 W/150 W 직접 결합 방법
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Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of radiated emissions. TEM cell and wideband TEM cell method
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IEC 61967-6-2002/AMD1-2008
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
修改件1.集成电路.150 kHz至1 GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法
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IEC 61967-2-2005
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Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
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IEC 61967-1-2018 RLV
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IEC 61967-1-2018
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IEC TR 61967-4-1-2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
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