1.1 本标准将为评估石墨烯和相关产品的横向薄片尺寸、平均薄片厚度、D带与G带的拉曼强度比以及碳/氧比的测量方法提供指导。这里包括的技术有原子力显微镜、拉曼光谱和X射线光电子能谱。将给出每种测量类型的示例。 1.2 本指南旨在为制造商、生产商、分析师和其他对石墨烯及氧化石墨烯和还原氧化石墨烯等相关产品感兴趣的人提供示例。 本标准指南无意全面概述所有可能的表征方法。 1.3 本指南不包括所有可能材料和应用的所有样品制备程序。用户必须验证其特定应用程序的适当性。 1.4 以国际单位制表示的数值应视为标准值。本标准不包括其他计量单位。 1.5 本标准并非旨在解决与其使用相关的所有安全问题（如有）。 本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.6 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 4.1 石墨烯显著的结构、物理和化学特性，特别是其机械强度、高电子迁移率、重量和透明度（单层或几层），在世界范围内产生了旨在开发实际应用的研究和工业生产努力。已经开发了各种工业上可扩展的生产方法，包括从小分子（有或没有衬底）生长石墨烯的自底向上方法，以及从顶部生长石墨烯的方法- 从石墨开始，通过机械、化学或电化学方法将其剥落，以生产纳米级产品，如石墨烯薄片。两种常见的去角质方法是:( 1. )石墨氧化为氧化石墨烯（GO），然后进行额外处理以形成还原氧化石墨烯（r-GO） ( 2. ) 而且( 2. )石墨的液相剥落 ( 3. ) . 剥离方法以及无基质自底向上方法以薄片形式生产材料，可分散在各种溶剂中，使其适合需要溶液处理的应用。 虽然市场上有许多商用“石墨烯”材料，但这些产品的质量参差不齐 ( 4. ) . 在评估材料的物理特性方面存在许多挑战。在本指南中，我们讨论了如何使用拉曼光谱（Raman）和X射线光电子光谱（XPS）以及原子力显微镜（AFM）来表征由石墨烯薄片和相关材料（即，多层石墨烯（FLG）、GO、r-GO）组成的材料。提供的示例显示了如何使用这些方法来识别存在的材料类型，并提取重要参数，包括横向薄片尺寸、平均薄片厚度、D和G模式的强度比（I D /一、 G )在拉曼光谱和碳氧比。具体而言，当遇到声称为“石墨烯”的“未知”材料或产品时，必须通过AFM量化厚度和横向薄片尺寸分布，使用拉曼光谱中D和G带的强度比评估薄片中的缺陷水平，并使用XPS确定材料的氧化水平（C/O比）。这些测量值对于现有材料类型的定性评估以及薄片质量的定量测量非常重要，这些测量值可以与基于导电性、光学透明度和化学反应性的应用相关的属性相关联。 4.2 应注意，这些材料和产品可能以粉末或分散体（液体）形式存在。其他技术和测量（ISO/TR 18196:2016），如X射线衍射（XRD）、光学显微镜、扫描电子显微镜（SEM）、透射电子显微镜（TEM）和表面积测量，也可用于石墨烯和相关产品的表征，但对这些方法的讨论超出了本指南的范围。

1.1 This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement. 1.2 This guide is intended to serve as an example for manufacturers, producers, analysts, and others with an interest in graphene and related products such as graphene oxide and reduced graphene oxide. This Standard Guide is not intended to be a comprehensive overview of all possible characterization methods. 1.3 This guide does not include all sample preparation procedures for all possible materials and applications. The user must validate the appropriateness for their particular application. 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 The remarkable structural, physical and chemical properties of graphene — particularly its mechanical strength, high electronic mobility, lightness, and transparency (single layer or a few layers) — have generated worldwide research and industrial production efforts aimed at developing practical applications. Various industrially scalable production methods have been developed, including bottom-up approaches that grow graphene from small molecules (with or without a substrate), and top-down methods that start with graphite and exfoliate it by mechanical, chemical or electrochemical methods to produce nanoscale product such as graphene flakes. Two common exfoliation methods are: ( 1 ) oxidation of graphite to graphene oxide (GO) followed by additional processing to form reduced graphene oxide (r-GO) ( 2 ) and, ( 2 ) liquid phase exfoliation of graphite ( 3 ) . The exfoliation methods, as well as substrate-less bottom-up approaches, produce materials in the form of flakes that can be dispersed in various solvents, making them suitable for applications requiring solution processing. Although there are many commercial “graphene” materials available on the market, the quality of these products is highly variable ( 4 ) . There are many challenges in assessing the physical properties of the materials. In this guide we discuss how Raman spectroscopy (Raman) and X-ray photoelectron spectroscopy (XPS), as well as atomic force microscopy (AFM) can be used to characterize materials consisting of flakes of graphene and related materials (that is, few layer graphene (FLG), GO, r-GO). Illustrative examples are provided showing how these methods can be used to identify the type of material present and to extract important parameters including lateral flake size, average flake thickness, ratio of intensities of the D and G modes (I D /I G ) in the Raman spectrum and carbon to oxygen ratio. Specifically, when encountering an “unknown” material or product purporting to be “graphene,” it is essential to quantify the thickness and lateral flake size distributions by AFM, to assess the level of defects in the flakes using the ratio of intensities of the D and G bands in the Raman spectrum, and to determine the level of oxidation of the material (C/O ratio) using XPS. These measurands are important for qualitative assessment of the type of material present, as well as quantitative measures of the quality of the flakes which can be correlated with properties relevant to applications based on conductivity, optical transparency, and chemical reactivity. 4.2 It should be noted that these materials and products may exist in either a powder or dispersion (in liquid) form. Other techniques and measurements (ISO/TR 18196:2016) such as X-ray diffraction (XRD), optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM) and surface area measurement, can also be used for characterization of graphene and related products but discussion of these methods is beyond the scope of this guide.