半导体集成电路 快闪存储器测试方法
Semiconductor integrated circuit—Measuring methods for flash memory

2018-06-07

半导体集成电路 PWM控制器测试方法
Semiconductor integrated circuits—Test methods of PWM controller

2023-09-07

半导体集成电路 驱动器测试方法
Semiconductor integrated circuits—Test method of driver device

2023-09-07

반도체 접적 회로의 환경 시험 방법 및 내구성 시험 방법
环境试验方法和耐久性试验方法半导体集成电路

1980-11-29

半导体集成电路 AC/DC变换器测试方法
Semiconductor integrated circuits—Test method of AC/DC converters

2023-09-07

半导体集成电路 第三代双倍数据速率同步动态随机存储器 （DDR3 SDRAM）测试方法
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)

2018-06-07

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
集成电路热测量方法电气试验方法（单半导体器件）

1995-12-01

Микросхемы интегральные и приборы полупроводниковые. Методы ускоренных испытаний на безотказность
集成电路和半导体器件 非故障运行加速测试方法

半导体集成电路封装结到外壳热阻测试方法
Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits

1993-12-30

宇航用半导体集成电路单粒子软错误时域测试方法
Time-domain test methods for space single event soft errors of semiconductor integrated circuit

2023-09-07