ISO 16526的本部分规定了直接和绝对测量高压发生器二次侧恒电位（DC）X射线系统平均高压的方法。其目的是检查与X射线系统控制单元上指示的高电压值的对应关系。 该方法用于确保X射线系统的可重复运行，因为电压特别影响材料的穿透力和X射线图像的对比度，以及辐射防护要求。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This part of ISO 16526 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system. This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.All current amendments available at time of purchase are included with the purchase of this document.