这些测试程序涵盖了具有线性脉冲整形网络的放大器和前置放大器系统，用于电离辐射光谱中的半导体、闪烁和比例探测器。目的是为脉冲放大器系统的用户和制造商提供通用语言和方法。 本标准取代IEEE Std 301-1976《电离辐射用半导体辐射探测器放大器和前置放大器的IEEE标准试验程序》。ANSI/IEEE Std 300-1988和ANSI/IEEE Std 325-1986中描述了相关探测器的测试程序。IEEE Std 194-1977是脉冲形状术语的配套文件。 并非本文所述的所有测试都是强制性的，但用于确定前置放大器和放大器规格的测试应符合本标准。 测量方法的重点是通过绕过测试仪器的局限性来提高灵敏度和准确性，尤其是只有一个用于读数的可视显示器的示波器。在可能的情况下使用零位技术，从而将基本误差减少到一对精密电阻器的不准确度。当使用电桥不合适时，例如在用示波器测量脉冲高度时，会使脉冲占据阴极射线管（CRT）表面的固定振幅和垂直位置。一些测量需要测试仪器或固定装置，但在本文撰写之际，这些仪器或固定装置并非商用；附录中给出了其结构的电路图。 使用标准核仪器模块测试放大器的性能是不可接受的，除非该模块引入的误差可以纠正或显示小于放大器引起的误差。例如，使用交叉拾取模块测量双极放大器中的交叉走行，以及使用MCA测量非线性和噪声。

These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology. Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard. The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.