Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test method for measuring generated power from flexible thermoelectric devices
半导体器件 用于能量收集和发电的半导体器件
This part of IEC 62830 specifies the test method for measuring generated electric power from flexible thermoelectric devices under bending conditions. This document provides terms, definitions, symbols, configurations, and test methods that can be used to evaluate and determine the performance of flexible thermoelectric devices. This document also describes the test conditions such as temperature, temperature difference, contact conditions, insulation and bending radius of flexible thermoelectric devices. This document is applicable to flexible energy harvesting devices for flexible semiconductor devices.All current amendments available at time of purchase are included with the purchase of this document.