IEC 63202的这一部分描述了在模拟阳光下测量晶体硅光伏（PV）电池光致退化（LID）的程序。晶体硅光伏电池中LID的大小是通过比较在标准测试条件（STC）下暴露于指定温度和辐照度下的模拟阳光之前和之后的最大输出功率来确定的。 本文件的目的是提供标准化的光伏电池盖信息，帮助光伏组件制造商最大限度地减少同一组件内电池之间的不匹配，从而最大限度地提高发电量。 与IEC 61215系列中描述的光伏组件盖子测量值相比，发现几个额外的实验因素对光伏电池盖子测试有显著影响，IEC 61215-2未考虑这些因素。本文件提供了一致的光伏电池盖测量所需的调节和测量程序以及参数设置。 盖子大小是细胞质量的一个重要因素。对于来自同一分拣箱的单元，最重要的因素是盖子后的输出功率分布。交叉引用:IEC 60904-9EN 60904-9IEC 60904-1IEC 60904-2EN 60904-2EN 60904-1购买本文件时可获得的所有现行修订均包含在购买本文件中。

This part of IEC 63202 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield. When compared to PV module LID measurements described in the IEC 61215 series, several extra experimental factors have been found to show significant impact on the PV cell LID test, which were not considered by IEC 61215-2. This document provides a conditioning and measurements procedure and parameter settings required for consistent PV cell LID measurements. LID magnitude is one important factor of cell quality. For cells from the same sorting bin, the most important factor is the distribution of output power after LID.Cross References:IEC 60904-9EN 60904-9IEC 60904-1IEC 60904-2EN 60904-2EN 60904-1All current amendments available at time of purchase are included with the purchase of this document.