本文件介绍了使用表面分析工具（第5条）可获得的有关纳米结构材料的信息类型（以及一些示例）。同样重要的是，确定了与表征纳米结构材料相关的一般问题或挑战，以及与单个方法相关的具体机遇或挑战（第6条）。随着物体或材料成分的尺寸接近几纳米，“体积”、“表面”和“颗粒”分析之间的区别变得模糊。虽然已经确定了一些与纳米结构材料表征相关的一般问题，但本文件主要关注与纳米结构材料表面化学分析相关的问题。将提及各种分析和表征方法，但本报告侧重于ISO/TC 201领域的方法，包括俄歇电子能谱、X射线光电子能谱、二次离子质谱和扫描探针显微镜。 本报告中未讨论通常在溶液中进行的纳米颗粒表面性质（如表面电位）的某些类型的测量。 尽管它们有许多相似的方面，但纳米厚薄膜或纳米大小颗粒的统一集合的表征呈现出不同的表征挑战。本文给出了适用于薄膜和颗粒或纳米物体的方法示例。可确定的性能包括:污染物的存在、涂层的厚度以及处理前后表面的化学性质。除了确定可以获得的信息类型外，本文件还总结了分析前或分析过程中必须考虑的一般性和技术性问题。 这些包括:所需信息的识别、稳定性和探针效应、环境效应、样本处理问题和数据解释。 表面表征是纳米材料分析需求的一个重要子集。纳米材料的更广泛表征需求在ISO/TC 229的范围内，本文件已与TC 229联合工作组（JWG）3的专家进行了协调。 这篇关于使用一套特定表面分析方法的纳米材料信息的介绍，就其本质而言，不可能完全完整。然而，已经确定了重要的机会、概念和问题，并提供了许多参考资料，以便根据需要更深入地研究这些主题。

This document provides an introduction to (and some examples of) the types of information that can be obtained about nanostructured materials using surface-analysis tools (Clause 5). Of equal importance, both general issues or challenges associated with characterizing nanostructured materials and the specific opportunities or challenges associated with individual methods are identified (Clause 6). As the size of objects or components of materials approaches a few nanometres, the distinctions among "bulk", "surface" and "particle" analysis blur. Although some general issues relevant to characterization of nanostructured materials are identified, this document focuses on issues specifically relevant to surface chemical analysis of nanostructured materials. A variety of analytical and characterization methods will be mentioned, but this report focuses on methods that are in the domain of ISO/TC 201 including Auger Electron Spectroscopy, X？ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning probe microscopy. Some types of measurements of nanoparticle surface properties such as surface potential that are often made in a solution are not discussed in this Report. Although they have many similar aspects, characterization of nanometre-thick films or a uniform collection of nanometre-sized particles present different characterization challenges. Examples of methods applicable to both thin films and to particles or nano-sized objects are presented. Properties that can be determined include: the presence of contamination, the thickness of coatings, and the chemical nature of the surface before and after processing. In addition to identifying the types of information that can be obtained, the document summarizes general and technique-specific Issues that must be considered before or during analysis. These include: identification of needed information, stability and probe effects, environmental effects, specimen-handling issues, and data interpretation. Surface characterization is an important subset of several analysis needs for nanostructured materials. The broader characterization needs for nanomaterials are within the scope of ISO/TC 229 and this document has been coordinated with experts of TC 229 Joint Working Group (JWG) 3. This introduction to information available about nanomaterials using a specific set of surface-analysis methods cannot by its very nature be fully complete. However, important opportunities, concepts and issues have been identified and many references provided to allow the topics to be examined in greater depth as required.