本标准定义了一种测试描述语言:a）便于将大量数字测试向量数据从CAE环境传输到自动测试设备（ATE）环境；b） 指定模式、格式和时序信息，这些信息足以定义数字测试向量对被测设备（DUT）的应用；c） 支持结构化测试（如扫描/自动测试模式生成（ATPG）、集成测试技术（如内置自测试（BIST））以及IC设计及其组件的功能测试规范生成的测试向量数据量，其格式针对ATE环境中的应用进行了优化。

This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.