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Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes 半导体器件
发布日期: 2020-01-14
IEC 60747的本部分规定了无荧光粉的单个发光二极管(LED)芯片或封装的辐射和非辐射电流的测量方法。用于照明应用的白色LED不在本文件范围内。本文件利用内部量子效率(IQE)作为电流的函数,其测量方法在其他文件中讨论。交叉引用:IEC 60747-5-6:2016IEC 60747-5-8:2019IEC 60747-5-9IEC 60747-5-10购买时可用的所有现行修订版均包含在本文件的购买中。
This part of IEC 60747 specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.Cross References:IEC 60747-5-6:2016IEC 60747-5-8:2019IEC 60747-5-9IEC 60747-5-10All current amendments available at time of purchase are included with the purchase of this document.
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发布单位或类别: 英国-英国标准学会
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