IEC TS 62607-6-5:20 22(E)建立了确定关键控制特性的标准化方法 接触电阻，以及 薄层电阻 对于石墨烯基材料和其他二维材料 传输线测量。 该方法使用通过光刻方法施加到2D材料的测试结构，该测试结构由几个金属电极组成，电极之间的间距增加。通过测量不同电极对之间的电压降，可以计算薄层电阻和接触电阻。 该方法可应用于在材料顶部上经受电金属接触的任何其它二维材料。 如果在二维材料和金属电极之间形成的电接触提供欧姆接触性质，则该方法提供准确和可再现的结果。

IEC TS 62607-6-5:2022(E) establishes a standardized method to determine the key control characteristics

• contact resistance, and
• sheet resistance

for graphene-based materials and other two-dimensional materials by a

• transmission line measurement.

The method uses test structures applied to the 2D material by photolithographic methods consisting of several metal electrodes with increasing spacing between the electrodes. By a measurement of the voltage drop between different pairs of electrodes, sheet resistance and contact resistance can be calculated.

• The method can be applied to any other two-dimensional materials which are subject to electrical metal contact on top of the materials.
• The method provides accurate and reproducible results, if the electrical contact formed between the two-dimensional material and the metal electrodes provides ohmic contact property.