IEC 60749-27:2006+A1:2012建立了一个标准程序，用于根据半导体器件因暴露于规定的机器模型（MM）静电放电（ESD）而损坏或退化的易感性对半导体器件进行测试和分类。它可以作为人体模型ESD测试方法的替代测试方法。目标是提供可靠、可重复的ESD测试结果，以便进行准确的分类。该测试方法适用于所有半导体器件，并被归类为破坏性。 本合并版本由第二版（2006年）组成 及其修正案1（2012）。因此，无须在 本出版物的补充。

IEC 60749-27:2006+A1:2012 Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive. This consolidated version consists of the second edition (2006) and its amendment 1 (2012). Therefore, no need to order amendment in addition to this publication.