1.1 本指南涵盖了确定电子半导体器件辐射硬度测试中使用的中子能量差注量谱的程序。本指南具体涵盖的中子源类型为稳态或脉冲模式下使用的裂变或退化能量裂变源。 1.2 本指南提供了在选择最适合可用数据且与所调查环境相关的频谱调整方法的过程中可以应用的指导和标准。 1.3 本指南将与指南一起使用 E720 用于表征中子谱，并与实践结合使用 E722 描述通常与电子半导体器件辐射硬度测试相关的损伤相关参数。 注1: 虽然是向导 E720 仅讨论活化箔传感器，可使用已知响应函数的任何能量相关中子响应传感器 ( 1. ) . 2. 注2: 有关本指南中使用的术语，请参阅术语 E170 . 1.4 以国际单位制表示的数值应视为标准值。本标准不包括其他计量单位。 1.5 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.6 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 4.1 了解用于电子设备辐射硬度测试的特定中子源的能谱很重要，以便将辐射效应与设备性能退化联系起来。 4.2 本指南描述了在选择和实施频谱调整方法时必须考虑的因素。 尽管指南中讨论了传感器（箔）的选择和响应（活动）的确定 E720 实验不应脱离分析。事实上，进行光谱测定的分析员密切参与实验设计是有利的，以确保获得的数据将提供尽可能准确的光谱。这些数据包括:( 1. )测量的响应，例如暴露在环境中的箔的活动及其不确定性( 2. )响应函数，如反应截面，以及适当的相关性和不确定性( 3. )测试环境中的几何形状和材料，以及( 4. )从输运计算或以往经验中获得的试验函数或先验谱及其不确定性。

1.1 This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode. 1.2 This guide provides guidance and criteria that can be applied during the process of choosing the spectrum adjustment methodology that is best suited to the available data and relevant for the environment being investigated. 1.3 This guide is to be used in conjunction with Guide E720 to characterize neutron spectra and is used in conjunction with Practice E722 to characterize damage-related parameters normally associated with radiation-hardness testing of electronic semiconductor devices. Note 1: Although Guide E720 only discusses activation foil sensors, any energy-dependent neutron-responding sensor for which a response function is known may be used ( 1 ) . 2 Note 2: For terminology used in this guide, see Terminology E170 . 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 It is important to know the energy spectrum of the particular neutron source employed in radiation-hardness testing of electronic devices in order to relate radiation effects with device performance degradation. 4.2 This guide describes the factors which must be considered when the spectrum adjustment methodology is chosen and implemented. Although the selection of sensors (foils) and the determination of responses (activities) is discussed in Guide E720 , the experiment should not be divorced from the analysis. In fact, it is advantageous for the analyst conducting the spectrum determination to be closely involved with the design of the experiment to ensure that the data obtained will provide the most accurate spectrum possible. These data include the following: ( 1 ) measured responses such as the activities of foils exposed in the environment and their uncertainties, ( 2 ) response functions such as reaction cross sections along with appropriate correlations and uncertainties, ( 3 ) the geometry and materials in the test environment, and ( 4 ) a trial function or prior spectrum and its uncertainties obtained from a transport calculation or from previous experience.