精细陶瓷粉体颗粒尺寸分布测试用样品的制备
Fine ceramics (advanced ceramics, advanced technical ceramics) - Sample preparation for the determination of particle size distribution of ceramic powders

2006-02-22

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
陶瓷和基本材料的测试 电热蒸发电感耦合等离子体发射光谱法直接测定碳化硅粉末和颗粒中杂质的质量分数

2015-11-30

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
陶瓷和基础材料的测试 - 通过电感耦合等离子体发射光谱法（ICP OES）与电热蒸发（ETV）直接测定碳化硅粉末和颗粒中杂质的质量分数

2015-11-25

Testing of ceramic raw and basic materials — Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials — Part 2: Inductively coupled plasma optical emission spectrometry (ICP/OES) or ion chromatography after burning in an oxygen flow
陶瓷原材料和基础材料的测试——非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定第2部分:在氧气流中燃烧后的电感耦合等离子体发射光谱法（ICP/OES）或离子色谱法

2013-02-14

Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
陶瓷原材料和基础材料的试验.用电感耦合等离子体发射光谱法（ICP OES）和电热蒸发法（ETV）直接测定碳化硅粉末和颗粒中杂质的质量分数

2008-07-01

Draft Document - Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
文件草案.陶瓷原材料和基础材料的试验.用电感耦合等离子体发射光谱法（ICP OES）和电热蒸发法（ETV）直接测定碳化硅粉末和颗粒中杂质的质量分数

2007-09-01

Testing of ceramic raw and basic materials - Determination of content of sulphur in powders and granules of non-oxidic ceramic raw and basic materials - Part 2: Optical emission spectrometry by inductively coupled plasma (ICP OES) or ion chromatography (IC) after burning in an oxygen flow
陶瓷原材料和基本材料的试验.非氧化陶瓷原材料和基本材料粉末和颗粒中硫含量的测定.第2部分:在氧气流中燃烧后用电感耦合等离子体（ICP OES）或离子色谱法（IC）进行光发射光谱测定

2007-11-01

Testing of ceramic raw and basic materials - Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials - Part 2: Inductively coupled plasma optical emission spectrometry (ICP/OES) or ion chromatography after burning in an oxygen flow (ISO 14720-2:2013)
陶瓷原材料和基础材料的测试 - 非氧化性陶瓷原料和基材的粉末和颗粒中的硫的测定 - 第2部分:氧气流中燃烧后的电感耦合等离子体发射光谱（ICP/OES）或离子色谱法14720-2:2013）

2013-03-06

Testing of ceramic raw and basic materials - Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials - Part 2: Inductively coupled plasma optical emission spectrometry (ICP/OES) or ion chromatography after burning in an oxygen flow (ISO 14720-2:2013)
陶瓷原材料和基本材料的试验.非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定.第2部分:在氧气流中燃烧后的电感耦合等离子体发射光谱法（ICP/OES）或离子色谱法（ISO 14720-2-2013）；德国版

2013-06-01

BS EN ISO 14720-2. Testing of ceramic raw and basic materials. Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials. Part 2. Inductively coupled plasma atomic emission spectrometry (ICP/AES) or ion chromatography after burning in an oxygen flow
BS EN ISO 14720-2 陶瓷原材料和基本材料的测试 非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定 第二部分 在氧气流中燃烧后的电感耦合等离子体原子发射光谱法（ICP/AES）或离子色谱法

2011-05-04

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
陶瓷原材料和基础材料的试验.在卤化反应的作用下 通过电感耦合等离子体（ICP OES）和电热蒸发（ETV）的光发射光谱法直接测定石墨粉末、颗粒和块状物中痕量杂质的质量分数

2017-05-01