IEC 62496-2:20 17(E)规定了一种定义光学电路板光学特性测量条件的方法。该方法包括使用代码参考查找表来识别测量环境的不同关键方面。从表中提取的值用于构建测量识别码，其本身捕获关于测量条件的足够信息，以便确保独立测量结果在可接受的范围内的一致性。规定了推荐的测量条件，以最大限度地减少独立测量结果的进一步变化。 关键词:带宽密度,光电路板的光学特性

IEC 62496-2:2017(E) specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.
Keywords: bandwidth density, optical characteristics of optical circuit boards