现行

MIL MIL-PRF-55681G Supplement 1

Capacitor, Chip, Multiple Layer, Fixed Ceramic Dielectric, Established Reliability and Non-Established Reliability, General Specification for
确定可靠性和非确定可靠性的多层固定陶瓷电介质芯片电容器通用规范

2016-07-12

现行

MIL MIL-PRF-55681/3E Notice 1-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR06
电容器芯片多层固定陶瓷介质既定可靠性与非既定可靠性CDR06

2011-10-20

现行

MIL MIL-PRF-55681/2D Notice 1-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR05
CDR05型已确定可靠性和未确定可靠性的多层固定陶瓷电介质芯片电容器

2011-10-20

现行

MIL MIL-PRF-55681/2D Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR05
CDR05型已确定可靠性和未确定可靠性的多层固定陶瓷电介质芯片电容器

2016-07-26

现行

MIL MIL-PRF-55681/2D-Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR05
CDR05型已确定可靠性和未确定可靠性的多层固定陶瓷电介质芯片电容器

2016-07-26

现行

MIL MIL-PRF-55681G

Capacitor, Chip, Multiple Layer, Fixed Ceramic Dielectric, Established Reliability and Non-Established Reliability, General Specification for
片式多层固定陶瓷电介质电容器 既有可靠性和非既有可靠性 通用规范

2016-07-12

现行

MIL MIL-PRF-55681/13

Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR37
电容器 芯片 多层 固定 陶瓷介质 既有可靠性和非既有可靠性 CDR37型

2016-07-12

现行

MIL MIL-PRF-55681/12

Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR36
电容器 芯片 多层 固定 陶瓷介质 既有可靠性和非既有可靠性 CDR36型

2016-07-12

现行

DOD DOD-C-55681/11

CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY STYLE CDR35 METRIC
已确立可靠性的陶瓷介质多层固定无封装片式电容器CDR35公制

1983-08-25

现行

MIL MIL-PRF-55681/8C Notice 1-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR32, Metric
CDR32型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2011-10-20

现行

MIL MIL-PRF-55681/7C Notice 1-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR31, Metrix
电容器 芯片 多层 固定 陶瓷电介质 已建立的可靠性和未建立的可靠性 CDR31型 Metrix

2011-10-20

现行

MIL MIL-PRF-55681/10C Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR34, Metric
CDR34型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2016-07-26

现行

MIL MIL-PRF-55681/7C Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR31, Metrix
电容器 芯片 多层 固定 陶瓷电介质 已建立的可靠性和未建立的可靠性 CDR31型 Metrix

2016-07-26

现行

MIL MIL-PRF-55681/9C Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR33, Metric
CDR33型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2016-07-26

现行

MIL MIL-PRF-55681/11C-Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR35, Metric
CDR35型固定式陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2016-07-26

现行

MIL MIL-PRF-55681/10C-Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR34, Metric
CDR34型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2016-07-26

现行

MIL MIL-PRF-55681/11C Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR35, Metric
CDR35型固定式陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2016-07-26

现行

MIL MIL-PRF-55681/8C Notice 2-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR32, Metric
CDR32型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2016-07-26

现行

MIL MIL-PRF-55681/9C Notice 1-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR33, Metric
CDR33型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2011-10-11

现行

MIL MIL-PRF-55681/11C Notice 1-Validation

Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR35, Metric
CDR35型固定式陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制

2011-10-11