现行

YS/T 15-2015

硅外延层和扩散层厚度测定磨角染色法
Test method for thickness of epitaxial layers and diffused layers by angle lap stain

2015-04-30

现行

YS/T 23-2016

硅外延层厚度测定　堆垛层错尺寸法
Test method for thickness of epitaxial layers—Stacking fault size

2016-04-05

现行

GB/T 30653-2014

Ⅲ族氮化物外延片结晶质量测试方法
Test method for crystal quality of III-nitride epitaxial layers

2014-12-31

现行

GB/T 30654-2014

Ⅲ族氮化物外延片晶格常数测试方法
Test method for lattice constant of III-nitride epitaxial layers

2014-12-31

现行

GB/T 30655-2014

氮化物LED外延片内量子效率测试方法
Test methods for internal quantum efficiency of nitride LED epitaxial layers

2014-12-31

现行

GB/T 14142-2017

硅外延层晶体完整性检验方法 腐蚀法
Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique

2017-09-29

现行

GB/T 42905-2023

碳化硅外延层厚度的测试 红外反射法
Test method for thickness of silicon carbide epitaxial layer—Infrared reflectance method

2023-08-06

现行

GB/T 14146-2021

硅外延层载流子浓度的测试 电容-电压法
Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method

2021-05-21

现行

SJ/T 10481-1994

硅外延层电阻率的面接触三探针方法
Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques

1994-04-11

现行

GB/T 11068-2006

砷化镓外延层载流子浓度电容-电压测量方法
Gallium arsenide epitaxial layer - determination of carrier concentration voltage-capacitance method

2006-07-18

现行

GB/T 14141-2009

硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array

2009-10-30

现行

DIN 65474

Aerospace; fibre reinforced plastics; thermal-spike test method
航空航天纤维增强塑料；热峰试验法

1992-11-01

现行

GB/T 14847-2010

重掺杂衬底上轻掺杂硅外延层厚度的红外反射测量方法
Test mothod for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance

2011-01-10

现行

GB/T 27858-2011

化学品 沉积物-水系统中摇蚊毒性试验 加标于水法
Chemicals - Sediment-water chironomid toxicity test - Spiked water method

2011-12-30

现行

GB/T 27859-2011

化学品 沉积物-水系统中摇蚊毒性试验 加标于沉积物法
Chemicals - Sediment-water chironomid toxicity test - Spiked sediment method

2011-12-30

现行

GB/T 42902-2023

碳化硅外延片表面缺陷的测试 激光散射法
Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method

2023-08-06

现行

YS/T 14-2015

异质外延层和硅多晶层厚度的测量方法
Test method for thickness of heteroepitaxy layers and polycrystalline layers

2015-04-30

现行

ECA/EIA 339

RECOMMENDED TEST METHOD LAYER-TO-LAYER ADHESION OF MAGNETIC TAPE
磁带层间附着力的推荐试验方法

1974-12-01

现行

ASTM F1575/F1575M-24

Standard Test Method for Determining Bending Yield Moment of Nails, Spikes, and Dowel-type Threaded Fasteners
钉子、销钉和销钉型螺纹紧固件弯曲屈服力矩测定的标准试验方法

2024-02-01

现行

ASTM C1871-22

Standard Test Method for Determination of Uranium Isotopic Composition by the Double Spike Method Using a Thermal Ionization Mass Spectrometer
用热电离质谱仪用双峰法测定铀同位素组成的标准试验方法

2022-02-01