ISO 23201:2015规定了一种波长色散X射线荧光光谱法，用于分析氧化铝中痕量的任何或所有以下元素:钠、硅、铁、钙、钛、磷、钒、锌、锰、镓、钾、铜、铬和镍。这些元素表示为基于未干燥样品的氧化物Na2O、SiO2、Fe2O3、CaO、TiO2、P2O5、V2O5、ZnO、MnO、Ga2O3、K2O、CuO、Cr2O3和NiO。该方法适用于冶炼级氧化铝。还给出了每种组分所覆盖的浓度范围。

ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na₂O, SiO₂, Fe2O₃, CaO, TiO₂, P₂O₅, V₂O₅, ZnO, MnO, Ga₂O₃, K2O, CuO, Cr₂O₃, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.