现行

BS ISO 16243-2011

Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
表面化学分析 X射线光电子能谱（XPS）中的数据记录和报告

2011-12-31

现行

GB/T 33502-2017

表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求
Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

2017-02-28

现行

ISO 16243-2011

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
表面化学分析——X射线光电子能谱（XPS）中的数据记录和报告

2011-11-25

现行

BS ISO 13424-2013

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
表面化学分析 X射线光电子能谱 薄膜分析结果的报告

2013-10-31

现行

ISO 13424-2013

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
表面化学分析——X射线光电子能谱；薄膜分析结果的报告

2013-09-23

现行

GB/T 36401-2018

表面化学分析　X射线光电子能谱　薄膜分析结果的报告
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

2018-06-07

现行

BS ISO 10810-2019

Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
表面化学分析 X射线光电子能谱 分析指南

2019-08-23

现行

GB/T 30704-2014

表面化学分析　X射线光电子能谱　分析指南
Surface chemical analysis—X-ray photoelectron spectroscopy—Guidelines for analysis

2014-06-09

现行

ISO 10810-2019

Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
表面化学分析 - X射线光电子能谱分析指南

2019-08-22

现行

BS ISO 19830-2015

Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 电子光谱 X射线光电子能谱峰拟合的最低报告要求

2015-11-30

现行

ISO 19830-2015

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 - 电子光谱 - X射线光电子能谱峰值拟合的最低报告要求

2015-11-05

现行

GB/T 41073-2021

表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求
Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

2021-12-31

现行

ISO/TR 18392-2005

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
表面化学分析——X射线光电子能谱；确定背景的程序

2005-11-17

现行

GB/Z 32490-2016

表面化学分析 X射线光电子能谱 确定本底的程序
Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds

2016-02-24

现行

BS ISO 16129-2018

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
表面化学分析 X射线光电子能谱 X射线光电子能谱仪日常性能评估程序

2018-11-19

现行

ISO 16129-2018

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
表面化学分析 - X射线光电子能谱 - 评估X射线光电子能谱仪日常性能的方法

2018-11-15

现行

BS ISO 19668-2017

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
表面化学分析 X射线光电子能谱 评估和报告均质材料中元素的检测限

2017-09-18

现行

AS ISO 19318-2006

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
表面化学分析.X射线光电子能谱.电荷控制和电荷校正方法的报告

2006-10-20

现行

BS ISO 19318-2021

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
表面化学分析 X射线光电子能谱 报告用于充电控制和充电校正的方法

2021-06-16

现行

KS D ISO 19318(2020 Confirm)

표면 화학 분석－X선 광전자 분광법－전하 제어와 전하 교정에 사용하는 방법
表面化学分析X射线光电子能谱电荷控制和电荷校正方法报告

2005-12-28