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Aging Mechanisms of Electrical Insulation Materials in a High Energy System 电绝缘材料在高能系统中的老化机制
发布日期: 2024-02-16
本报告的目的是作为一份介绍性(教育性)文件,涵盖飞机电力系统中高压电气部件或高压电气设备中与EIS相关的潜在故障机制。它包括以下内容:(1)概述了目前对飞机高电压和高功率应用中与EIS相关的潜在故障机制的理解;(2) 飞机电力系统中使用的电气部件EIS的主要老化应力源和老化过程及其常见故障模式,以及(3)评估电气绝缘退化状态的关键指标和相关测试需求。本文件旨在帮助高压电力系统设计者理解飞机高压部件EIS设计和测试的关键考虑因素,以及预测其设计使用寿命的要求。详细的测试指南,包括测试方法,将在ARP7375中提供,寿命建模将在ARP7380中提供。
The objective of this report is to serve as an introductory (educational) document to cover the potential failure mechanisms related to EIS in high voltage electrical component or HV electrical equipment in aircraft power systems. It has the following contents: (1) an overview of the current understandings of potential failure mechanisms related to EIS for high voltage and high-power application in aircraft; (2) main aging stressors and aging processes of EIS in electrical components used in the aircraft power systems and their common failure modes, and (3) the key indicators to assess the status of electrical insulation degradation and related testing needs.This document aims to assist HV power system designers in understanding the key considerations for EIS design and testing of HV components in aircraft, as well as the requirements for predicting their designed service life. Detailed testing guideline including testing methods will be provided in ARP7375, and life modeling in ARP7380.
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