Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 电子光谱 X射线光电子能谱峰拟合的最低报告要求

2015-11-30

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 - 电子光谱 - X射线光电子能谱峰值拟合的最低报告要求

2015-11-05

Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)
表面化学分析——俄歇电子能谱（AES）中数据的记录和报告

2011-11-25

表面化学分析 俄歇电子能谱（AES）数据记录与报告的规范要求
Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)

2016-02-24

Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
表面化学分析 俄歇电子能谱 报告用于充电控制和充电校正的方法

2010-02-28

表面化学分析 俄歇电子能谱 荷电控制与校正方法报告的规范要求
Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction

2016-10-13

Surface chemical analysis — Auger electron spectroscopy — Reporting of methods used for charge control and charge correction
表面化学分析——俄歇电子能谱；报告用于充电控制和充电校正的方法

2010-02-05

Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
表面化学分析.俄歇电子能谱（AES）中数据的记录和报告（ISO 16242-2011）；英文文本

2020-05-01

Государственная система обеспечения единства измерений. Химический анализ поверхности. Оже-электронная спектроскопия. Регистрация и представление данных
确保测量一致性的状态系统 表面化学分析 俄歇电子能谱（AES）中的记录和报告数据

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
表面化学分析 俄歇电子能谱和X射线光电子能谱 报告结果时用于确定峰值强度和所需信息的方法

2019-02-15

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
表面化学分析 - 俄歇电子光谱和X射线光电子能谱 - 用于确定峰值强度的方法和报告结果时所需的信息

2019-02-13

表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results

2024-03-15