ISO 19830:2015标准定义了如何报告X射线光电子能谱中的峰值拟合和峰值拟合结果。它适用于拟合单个光谱或一组相关光谱，例如在深度剖面测量期间可能获得的光谱。本国际标准提供了这些参数的列表，如果要实现可再现的峰拟合，或要拟合多个光谱并比较拟合的光谱，则应报告这些参数。本国际标准不提供峰值拟合说明，也不提供应采用的程序。

ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.