现行

GB/T 36401-2018

表面化学分析　X射线光电子能谱　薄膜分析结果的报告
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

2018-06-07

现行

ISO 13424-2013

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
表面化学分析——X射线光电子能谱；薄膜分析结果的报告

2013-09-23

现行

BS ISO 13424-2013

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
表面化学分析 X射线光电子能谱 薄膜分析结果的报告

2013-10-31

现行

ISO 16242-2011

Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)
表面化学分析——俄歇电子能谱（AES）中数据的记录和报告

2011-11-25

现行

GB/T 32565-2016

表面化学分析 俄歇电子能谱（AES）数据记录与报告的规范要求
Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)

2016-02-24

现行

BS ISO 16243-2011

Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
表面化学分析 X射线光电子能谱（XPS）中的数据记录和报告

2011-12-31

现行

GB/T 33502-2017

表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求
Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

2017-02-28

现行

ISO 16243-2011

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
表面化学分析——X射线光电子能谱（XPS）中的数据记录和报告

2011-11-25

现行

ISO 20579-1-2024

Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
表面化学分析——样品处理、制备和安装——第1部分:分析前样品处理的记录和报告

2024-09-18

现行

BS ISO 20579-4-2018

Surface chemical analysis. Guidelines to sample handling, preparation and mounting-Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
表面化学分析 样品处理、制备和安装指南

2018-04-24

现行

ISO 29081-2010

Surface chemical analysis — Auger electron spectroscopy — Reporting of methods used for charge control and charge correction
表面化学分析——俄歇电子能谱；报告用于充电控制和充电校正的方法

2010-02-05

现行

BS ISO 29081-2010

Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
表面化学分析 俄歇电子能谱 报告用于充电控制和充电校正的方法

2010-02-28

现行

GB/T 32998-2016

表面化学分析 俄歇电子能谱 荷电控制与校正方法报告的规范要求
Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction

2016-10-13

现行

ISO 20579-4-2018

Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
表面化学分析 - 样品处理 准备和安装 - 第4部分:纳米材料报告要求 分析挑战和溶液提取方法

2018-04-17

现行

GB/T 42658.4-2023

表面化学分析 样品处理、制备和安装指南 第4部分: 报告表面分析前纳米物体相关的来历、制备、处理和安装信息
Surface chemical analysis—Guidelines to sample handling, preparation and mounting—Part 4:Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis

2023-08-06

现行

GB/T 25185-2010

表面化学分析　X射线光电子能谱　荷电控制和荷电校正方法的报告
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction

2010-09-26

现行

KS D ISO 19318(2020 Confirm)

표면 화학 분석－X선 광전자 분광법－전하 제어와 전하 교정에 사용하는 방법
表面化学分析X射线光电子能谱电荷控制和电荷校正方法报告

2005-12-28

现行

ISO 19668-2017

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
表面化学分析.X射线光电子能谱.均匀材料中元素的估计和报告检测限

2017-08-14

现行

ISO 19830-2015

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 - 电子光谱 - X射线光电子能谱峰值拟合的最低报告要求

2015-11-05

现行

ISO 19318-2021

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction
表面化学分析 - X射线光电子能谱 - 报告用于充电控制和电荷校正的方法

2021-06-04