Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
电子元件质量评定协调体系 半导体器件 离散设备 场效应晶体管 开关用外壳额定场效应晶体管空白详细规范

1996-12-15

低频放大管壳额定的双极型晶体管空白详细规范
Blank detail specification for case-rated bipolar transistors for low-frequency amplification

1996-07-09

Semiconductor devices. Discrete devices-Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification-BDS for microwave field-effect transistors
半导体器件 分立器件

2000-09-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于外壳额定功率放大器应用的场效应晶体管

1993-07-15

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
电子元件质量评定协调体系规范 空白详细规范 半导体器件 离散设备 场效应晶体管 5W和1GHz以下单栅场效应晶体管空白详细规范

1988-12-15

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors
电子元件质量评定协调体系规范 空白详细规范:单栅场效应晶体管

1978-02-15

半导体器件 分立器件 第4-1部分：微波二极管和晶体管 微波场效应晶体管空白详细规范
Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification

2007-06-29

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification
电子元件质量评定协调体系规范 空白详细规范:低频放大用外壳额定双极晶体管

1976-08-15

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification
电子元件质量评定协调体系规范 空白详细规范:高频放大用外壳额定双极晶体管

1976-09-15

半导体器件 分立器件第8-2部分：超结金属氧化物半导体场效应晶体管空白详细规范
Semiconductor devices-Discrete devices Part 8-2: Blank detail specification for super junction metal-oxide-semiconductor field-effect transistors

2018-04-30

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频放大的外壳额定双极晶体管

1990-02-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于高频放大的外壳额定双极晶体管

1991-11-15