BS EN 62496-2:2017规定了一种定义测量条件的方法 光学电路板的光学特性。该方法包括使用代码 参考查找表，以确定测量环境的不同关键方面。 从表格中提取的值用于构造测量识别码， 其本身捕获了有关测量条件的足够信息，以便 确保独立测量结果的一致性在可接受的范围内。 规定了推荐的测量条件，以最大限度地减少温度的进一步变化 独立测量的结果。交叉引用:IEC 60068-2-64:2008IEC 61300-3-53:2015 ED1IEC 60068-2-27:2008IEC 62496-2-1:2011ISO 3534-1:2006IEC 61300-1:2016IEC 62614:2010IEC 60068-2-47:1999IEC TR 62658IEC TS 62661-2-1IEC 60825-1IEC 60793-2IEC 62496-4-1IEC 61745: 2017IEC 60793-1-43:2015IEC 62496-1:2008IEC 61280-4-1:2009IEC TR 62349:2014IEC 62496-2-4:2013购买本文件时可用的所有现行修订版均包含在购买本文件中。

BS EN 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.Cross References:IEC 60068-2-64:2008IEC 61300-3-53:2015 ED1IEC 60068-2-27:2008IEC 62496-2-1:2011ISO 3534-1:2006IEC 61300-1:2016IEC 62614:2010IEC 60068-2-47:1999IEC TR 62658IEC TS 62661-2-1IEC 60825-1IEC 60793-2IEC 62496-4-1IEC 61745:2017IEC 60793-1-43:2015IEC 62496-1:2008IEC 61280-4-1:2009IEC TR 62349:2014IEC 62496-2-4:2013All current amendments available at time of purchase are included with the purchase of this document.