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Smart Cards; Technical Report to improve test equipment integrity (Release Independent) 智能卡;改进测试设备完整性的技术报告(独立发布)
发布日期: 2015-11-01
本文档提供了如何优化设置测试环境,以根据ETSI TC SCP测试规范执行测试用例实现。 这包括(但不限于):建立测试环境的衍生指南;测试序列触发额外活动时的测试设备行为;优化测试环境;使用单线协议时的噪声问题;限制噪音影响;检查测试环境的完整性;完整性检查的测试用例示例。本文档的目标受众是基于ETSI TC SCP测试规范的测试用例实现的用户以及测试设备制造商。
The present document provides how to optimally set up the test environment to execute test case implementations based on ETSI TC SCP test specifications. This includes (but is not limited to):Derived guidelines to set up a test environment;Test equipment behaviour in case of additional activity triggered by test sequences;Optimization of the test environment;Noise issues when using the Single Wire Protocol;Limiting the noise impacts;Checking the integrity of the test environment;Example of a Test Case for Integrity check.The targeted audience for the present document is users of test case implementations based on ETSI TC SCP test specifications as well as test equipment manufacture.
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