现行

BS ISO 18516-2006

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率的测定

2006-11-30

现行

GB/T 28632-2012

表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率测定
Surface chemical analysis － Auger electron spectroscopy and X-ray photoelectron spectroscopy － Determination of lateral resolution

2012-07-31

现行

KS D ISO 19319(2020 Confirm)

표면 화학 분석－오제 전자 분광법과 X선 광전자 분광법－측면 분해능, 분석 영역,분석기로 측정한 시료 범위의 결정
表面化学分析－俄歇电子能谱和X射线光电子能谱－分析仪横向分辨率、分析面积和样品面积的测定

2005-12-28

现行

GB/T 29556-2013

表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率、分析面积和分析器所能检测到的样品面积的测定
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - determination of lateral resolution, analysis area, and sample area viewed by the analyser

2013-07-19

现行

ISO/TR 18394-2016

Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
表面化学分析.俄歇电子光谱.化学信息的推导

2016-05-02

现行

BS PD ISO/TR 18394-2016

Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
表面化学分析 俄歇电子能谱 化学信息的推导

2016-05-31

现行

GB/Z 32494-2016

表面化学分析 俄歇电子能谱 化学信息的解析
Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information

2016-02-24

现行

GB/T 30702-2014

表面化学分析　俄歇电子能谱和X射线光电子能谱　实验测定的相对灵敏度因子在均匀材料定量分析中的使用指南
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

2014-06-09

现行

KS D ISO 18118(2020 Confirm)

표면 화학 분석－오제 전자 분광법과 X선 광전자 분광법－균질 재료의 정량 분석을 위해 실험으로 결정된 상대 감도 인자의 사용 지침
表面化学分析俄歇电子能谱和X射线光电子能谱均匀材料定量分析用实验测定的相对灵敏度因子的使用指南

2005-12-28

现行

BS ISO 18118-2015

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
表面化学分析 俄歇电子能谱和X射线光电子能谱 均质材料定量分析用实验测定的相对灵敏度系数的使用指南

2015-04-30

现行

KS D ISO 21270(2020 Confirm)

표면 화학 분석－X선 광전자 및 오제 전자 분광계－세기 눈금의 직선성
表面化学分析X射线光电子能谱仪和俄歇电子能谱仪强度标度的线性

2005-12-28

现行

ISO 21270-2004

Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
表面化学分析——X射线光电子能谱仪和俄歇电子能谱仪——强度标度线性

2004-06-15

现行

BS ISO 21270-2004

Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
表面化学分析 X射线光电子能谱仪和俄歇电子能谱仪 强度标度的线性

2005-03-31

现行

GB/T 21006-2007

表面化学分析 X射线光电子能谱仪和俄歇电子能谱仪 强度标的线性
Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

2007-07-31

现行

GB/T 30704-2014

表面化学分析　X射线光电子能谱　分析指南
Surface chemical analysis—X-ray photoelectron spectroscopy—Guidelines for analysis

2014-06-09

现行

ISO 10810-2019

Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
表面化学分析 - X射线光电子能谱分析指南

2019-08-22

现行

BS ISO 10810-2019

Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
表面化学分析 X射线光电子能谱 分析指南

2019-08-23

现行

ISO 20903-2019

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
表面化学分析 - 俄歇电子光谱和X射线光电子能谱 - 用于确定峰值强度的方法和报告结果时所需的信息

2019-02-13

现行

BS ISO 20903-2019

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
表面化学分析 俄歇电子能谱和X射线光电子能谱 报告结果时用于确定峰值强度和所需信息的方法

2019-02-15

现行

GB/T 28893-2024

表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results

2024-03-15